Information on the SIMS technique and guidance on how to prepare and submit samples for analysis at the NERC Ion Micro-Probe facility. SIMS technique Find out more about the SIMS technique used by the Ion Microprobe, explaining how an ion beam is used to analyse tiny areas of a sample for detailed elemental and isotopic information. Sample preparation and sample requirements Information on specimen requirements as well as guidance and examples for sample preparation. Epoxy resins We have provided information which present the results from various measurements on the commonly used resins, together with comments on their suitability and advice on sample preparation. Standard materials available We have standard materials available free of charge to other academic institutions This article was published on 2026-02-18
